For more than 30 years, CERAP Prévention and its subsidiaries have been supporting energy stakeholders in a global prevention approach.
From construction to operation, to dismantling, our employees are involved on a daily basis in the health and safety of workers and the safety of facilities:
Services provided by ATRON METROLOGY are based on:
Method of calibration control of radiation survey meters usually implemented:
Objectives of ATRON:
Envisaged way:
Singletron 3.5 MeV
Reports edition:
Scope available on www.cofrac.fr
Site plan:
Objective: regulate the accelerator current at low dose rates
Specifications:
Definition of a scanning function on the target
Homogeneity of the irradiation field: up to 99,8% on +/-15°
Design of an adapted samples carousel:
KERMA in air, Kair, cinetic energy transfered to the charged particules (Gy or J/kg): Kair=KC+KR
KC: At the electronical balance (compensation of the energy of charged particules entering and leaving the volume), KC=D; KR: Contribution of the braking rays
Measurement of the KERMA in air and associated uncertainty:
Conversion from Kair to H*(10):
Calibration of radiation survey meters:
Removable X target:
Irradiation chamber allowing to simulate extreme environmental conditions:
Effects of radiation on electronic devices and materials depends on:
Consequences:
SEEs are Random Events:
Many types of SEEs: SET, SEU, MCU, SEFI, ISB, SEL, SEB, SEGR/SEDR, etc.
Single Events Effects (SEE) depends on LET (MeV.cm²/mg)
Sensor degradation is a significant constraint for payloads and star trackers (CCDs):
Displacement Damage (TNID) depends on NIEL (MeV.cm²/g)
Component degradation is very much dependent on a device technology, process and bias conditions
TID is mainly a semiconductor oxide effect :
Total Ionizing Dose (TID) depends on D (Gy)
ATRON is a contributing member of the RADNEXT program (H2020), WP7-JRA3 "cumulative radiation effects on electronics" (TID)
Submission of a request for modification of the RCC-E code (AFCEN) aimed at consolidating this equivalence: